It is applicable to IGBT, FRD, high voltage and high current test, solar cell test, diode transistor test, back electrode test, etc. in wafer factories, research institutes and universities.
The sample suction cup can move four degrees of freedom to facilitate scanning and focusing. The vibration isolation base is designed to facilitate fine measurement.
HGPS200 probe station:
High flatness: precision ground ferromagnetic stainless steel table top
Compact structure: overall design
Visual test: binocular microscope
Flexible test: suction cup air hole is controlled independently
HGPT-PS200 multifunctional vibration isolation magnetic absorption workbench:
The base can be purchased separately
Convenient and free construction
Various probe measurement experimental systems or other experimental platform systems
The manual precision vibration isolation probe table adopts the vibration isolation support design base to realize fine measurement
When using the isolation support, the 1 micron probe tip has no jitter and is clearly visible, and the ordinary rigid support has obvious jitter.