Product features:

1. The probe table is mainly used in the research and development of precision electrical measurement of semiconductor industry, photoelectric industry, integrated circuit and packaging, complex and high-speed devices, in order to ensure quality and reliability, and reduce the research and development time and the cost of device manufacturing process.

2. HGPS100 probe station is a manual probe station with complete configuration, good integrity and economic benefits. It is applicable to IGBT, FRD, voltage and current test, solar cell test, diode transistor test and back electrode test in dry wafer factories, research institutes and universities.

3. In addition to conventional component related tests, HGPS100 probe table is also widely used in crack detection, flaw detection and jewelry identification of various materials and devices.